Quantitative Measurement of Colorimetric Signals in 180nm Standard CMOS Technology
dc.authorid | Sarioglu, Baykal/0000-0002-7433-3823 | |
dc.authorwosid | Gul, Ozgur/A-7841-2011 | |
dc.contributor.author | Celikdemir, Caner | |
dc.contributor.author | Tekin, Engincan | |
dc.contributor.author | Ucar, Busra | |
dc.contributor.author | Gul, Ozgur | |
dc.contributor.author | Sarioglu, Baykal | |
dc.date.accessioned | 2024-07-18T20:49:16Z | |
dc.date.available | 2024-07-18T20:49:16Z | |
dc.date.issued | 2019 | |
dc.department | İstanbul Bilgi Üniversitesi | en_US |
dc.description | 11th International Conference on Electrical and Electronics Engineering (ELECO) -- NOV 28-30, 2019 -- Bursa, TURKEY | en_US |
dc.description.abstract | In this work, a CMOS based optical read-out system for biomarker sensing is presented. An integrated circuit containing an on-chip photodiode is designed an manufactured in 180nm UMC CMOS Technology. A 3D Printed structure is designed for holding both IC and the marker paper together. Laser light with 637 nm wavelength is applied to the marker paper and the CMOS IC. Optical measurements carried-out are based on the light transmissivity of the marker paper. Both photovoltaic and photoconductive measurements are carried out. The markers are successfully detected with 5mW to 20mW optical power. Images of the marker lines with varying intensity are generated from the measurements. Lastly, theoretical equations are derived, and the feasibility of the system for low power biomarker sensing applications is shown. | en_US |
dc.description.sponsorship | Chamber Elect Engineers Bursa Branch,Bursa Uludag Univ, Dept Elect Elect Engn,Istanbul Tech Univ, Fac Elect & Elect Engn,IEEE Turkey Sect | en_US |
dc.description.sponsorship | Scientific and Technological Research Council of Turkey (TUBITAK) [114E549] | en_US |
dc.description.sponsorship | This work is supported by The Scientific and Technological Research Council of Turkey (TUBITAK) Project No 114E549. | en_US |
dc.identifier.doi | 10.23919/eleco47770.2019.8990646 | |
dc.identifier.endpage | 370 | en_US |
dc.identifier.scopus | 2-s2.0-85080934834 | en_US |
dc.identifier.scopusquality | N/A | en_US |
dc.identifier.startpage | 367 | en_US |
dc.identifier.uri | https://doi.org/10.23919/eleco47770.2019.8990646 | |
dc.identifier.uri | https://hdl.handle.net/11411/8130 | |
dc.identifier.wos | WOS:000552654100068 | en_US |
dc.identifier.wosquality | N/A | en_US |
dc.indekslendigikaynak | Web of Science | en_US |
dc.indekslendigikaynak | Scopus | en_US |
dc.language.iso | en | en_US |
dc.publisher | IEEE | en_US |
dc.relation.ispartof | 2019 11th International Conference on Electrical and Electronics Engineering (Eleco 2019) | en_US |
dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.subject | System | en_US |
dc.title | Quantitative Measurement of Colorimetric Signals in 180nm Standard CMOS Technology | en_US |
dc.type | Conference Object | en_US |